Deterministic Circular Self Test Path

نویسندگان

  • Ke WEN
  • Yu HU
  • Xiaowei LI
چکیده

CSTP (Circular Self Test Path) is an attractive technique for testing sequential circuits in the nanometer era because it can easily provide at-speed test. But the area overhead of CSTP is high if random-pattern-resistant faults need to be reliably tested. This paper presents a deterministic CSTP (DCSTP) structure that embeds pre-computed test data with predictable area overhead. Experimental results on ISCAS’89 benchmarks indicate that complete fault coverage can be obtained with low area overhead, especially for large circuit.

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تاریخ انتشار 2006